Fault detection effectiveness of weighted random patterns

Authors:
J. A. Waicukauski;E. Lindbloom
Affiliations:
IBM Corporation, East Fishkill, N. Y.;IBM Corporation, Kingston, N. Y.
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

Citing 5
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Abstract

Performance results are given for the use of a newly developed weighted random pattern test generator, WRP, on 10 benchmark designs. Deterministic and WRP tests created for single stuck faults are compared in their ability to detect shorts and transition faults.