Sufficient testing in a self-testing environment

Authors:
T. W. Williams
Affiliations:
IBM, Boulder, Colorado
Venue:
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Year:
1984

Citing 7
Cited 0

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Abstract

This paper uses a relation of fault coverage and defect level to determine the number of random patterns required to obtain a certain defect level. This technique has application to networks which use self-testing.