An integrated 10 GHz low-noise phase-locked loop with improved PVT tolerance

  • Authors:
  • Kai Hu;Sabbir A. Osmany;J. Christoph Scheytt;Frank Herzel

  • Affiliations:
  • IHP, Frankfurt (Oder), Germany 15236;IHP, Frankfurt (Oder), Germany 15236;IHP, Frankfurt (Oder), Germany 15236;IHP, Frankfurt (Oder), Germany 15236

  • Venue:
  • Analog Integrated Circuits and Signal Processing
  • Year:
  • 2011

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Abstract

An integrated phase-locked loop (PLL) with low phase noise is presented, which is robust with respect to variations of device parameters with process, supply voltage, and temperature (PVT). The low-noise CMOS voltage-controlled oscillator (VCO) employs two varactors for fine and coarse tuning. By using a CMOS charge pump with output biasing, the dc fine tuning voltage of the VCO and the loop dynamics of the PLL are well defined and fairly independent of PVT variations. Device noise in the charge pump and linearity of the phase detector are much improved by a two-transistor charge pump architecture for fine tuning. We measured a phase noise below 驴131 dBc/Hz at 10 MHz offset and below 驴94 dBc/Hz at 10 kHz offset over a tuning range of 1.2 GHz. An integrated phase error below 0.6° was measured, corresponding to an rms jitter below 160 fs. The chip was produced in a 0.25 μm low-cost SiGe BiCMOS technology, occupies a chip area of 2.25 mm2 and draws 60 mA from a 3 V supply.