Explicit length modelling for statistical machine translation

  • Authors:
  • Joan Albert Silvestre-Cerdà;Jesús Andrés-Ferrer;Jorge Civera

  • Affiliations:
  • Departament de Sistemes Informàtics i Computació, Universitat Politècnica de València;Departament de Sistemes Informàtics i Computació, Universitat Politècnica de València;Departament de Sistemes Informàtics i Computació, Universitat Politècnica de València

  • Venue:
  • IbPRIA'11 Proceedings of the 5th Iberian conference on Pattern recognition and image analysis
  • Year:
  • 2011

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Abstract

Explicit length modelling has been previously explored in statistical pattern recognition with successful results. In this paper, two length models along with two parameter estimation methods for statistical machine translation (SMT) are presented. More precisely, we incorporate explicit length modelling in a state-of-the-art log-linear SMT system as an additional feature function in order to prove the contribution of length information. Finally, promising experimental results are reported on a reference SMT task.