Test compression for dynamically reconfigurable processors

  • Authors:
  • Hiroaki Inoue;Junya Yamada;Hideyuki Yoneda;Katsumi Togawa;Masato Motomura;Koichiro Furuta

  • Affiliations:
  • NEC Corporation;Renesas Electronics;Renesas Electronics;Renesas Electronics;NEC Corporation;Renesas Electronics

  • Venue:
  • ACM Transactions on Reconfigurable Technology and Systems (TRETS)
  • Year:
  • 2011

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Abstract

We present the world's first test compression technique that features automation of compression rules for test time reduction on dynamically reconfigurable processors. Evaluations on an actual 40-nm product show that our technique achieves a 2.7 times compression ratio for original configuration information (better than does GZIP), the peak decompression bandwidth of 1.6 GB/s, and 2.7 times shorter test times.