IBM Journal of Research and Development
Monte Carlo analysis of semiconductor devices: the DAMOCLES program
IBM Journal of Research and Development
CMOS scaling in the 0.1-&mgr;m, 1.X-volt regime for high-performance applications
IBM Journal of Research and Development - Special issue: IBM CMOS technology
Directions in Futrue High End Processors
ICCD '92 Proceedings of the 1991 IEEE International Conference on Computer Design on VLSI in Computer & Processors
Minimized Power Consumption for Scan-Based BIST
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Iddq Testing for High Performance CMOS - The Next Ten Years
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Changes in material properties of low-kinterlayer dielectric polymers induced by exposure to plasmas
Microelectronic Engineering
Minimized Power Consumption For Scan-Based Bist
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Scaling the gate dielectric: materials, integration, and reliability
IBM Journal of Research and Development
IBM Journal of Research and Development
CMOS design near the limit of scaling
IBM Journal of Research and Development
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