Microarchitectural synthesis for rapid BIST testing

• Authors: A. Orailoglu
• Venue: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
• Year: 2006

The impact of testability on design cost necessitates its consideration during the earliest stages of synthesis. Built-in self test (BIST) is an accepted testing approach, but its application to many designs is limited by the long test application time required to achieve high fault coverage. This work addresses the problem of BIST test time for high fault coverage by targeting test concurrency during high-level and structural synthesis. High-level synthesis generates RTL circuits which guarantee concurrent controllability and observability of all hardware components from test registers. Structural synthesis for testability completes the microarchitectural definition by specifying the test registers in the circuit, and defining a BIST test plan for the circuit. Remaining test conflicts are avoided without reducing test throughput by using partial-intrusion BIST to enable test data to be pipelined through nontest registers. The use of pipelined BIST testing in conjunction with high-level synthesis for test conflict minimization enables reduced test time through high test concurrency. Partial-intrusion BIST reduces the number of test registers by using nontest registers to propagate test data. Both behavioral and structural synthesis are directed by testability metrics which measure the test concurrency of a design. The use of these metrics in an integrated behavioral synthesis system pioneers the inclusion of test concurrency issues in microarchitectural synthesis. Experimental results using this synthesis system, SYNCBIST, show that designs generated by this approach are testable with few patterns, and using few test registers