A High-Level BIST Synthesis Method Based on a Region-wise Heuristic for an Integer Linear Programming

  • Authors:
  • Han Bin Kim;Dong Sam Ha

  • Affiliations:
  • -;-

  • Venue:
  • ITC '99 Proceedings of the 1999 IEEE International Test Conference
  • Year:
  • 1999

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Abstract

A high-level built-in self-test (BIST) synthesisinvolves several tasks such as system register assignment,interconnection assignment, and BIST register assignment.Existing high-level BIST synthesis methods perform thetasks sequentially at the cost of global optimality. Weproposed a new approach based on an integer linearprogramming (ILP) [18]. Our method achieves optimalsolutions for most circuits in hardware overhead, but ittakes a long processing time. In this paper, we present aheuristic method to address this problem. The heuristicpartitions a given data flow graph into smaller regionsbased on control steps and applies the ILP for each regionsuccessively. Our heuristic reduces the processing time byseveral orders of magnitude, while the quality of thesolution is slightly compromised. We present experimentalresults for six circuits and compare the results with otherBIST synthesis methods.