Cellular automata as a built in self test structure
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
LFSR Characteristic Polynomials for Pseudo-Exhaustive TPG with Low Number of Seeds
Journal of Electronic Testing: Theory and Applications
Pseudoexhaustive TPG with a Provably Low Number of LFSR Seeds
ICCD '00 Proceedings of the 2000 IEEE International Conference on Computer Design: VLSI in Computers & Processors
A BIST Pattern Generator Design for Near-Perfect Fault Coverage
IEEE Transactions on Computers
Challenges and directions for testing IC
Integration, the VLSI Journal
A scalable test structure for multicore chip
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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A new and effective pseudorandom test pattern generator, termed GLFSR, is introduced. These are linear feedback shift registers (LFSR's) over a Galois field GF(2δ), (δ>1). Unlike conventional LFSR's, which are over GF(2), these generators are not equivalent to cellular arrays and are shown to achieve significantly higher fault coverage. Experimental results are presented in this paper depicting that the proposed GLFSR can attain fault coverage equivalent to the LPSR, but with significantly fewer patterns. Specifically, results obtained demonstrate that in combinational circuits, for both stuck-at as well as transition faults, the proposed GLFSR outperforms all conventional pattern generators. Moreover, these experimental results are validated by certain randomness tests which demonstrate that the patterns generated by GLFSR achieve a higher degree of randomless