Wattch: a framework for architectural-level power analysis and optimizations
Proceedings of the 27th annual international symposium on Computer architecture
Automatically characterizing large scale program behavior
Proceedings of the 10th international conference on Architectural support for programming languages and operating systems
Temperature-aware microarchitecture
Proceedings of the 30th annual international symposium on Computer architecture
SMARTS: accelerating microarchitecture simulation via rigorous statistical sampling
Proceedings of the 30th annual international symposium on Computer architecture
EXPERT: expedited simulation exploiting program behavior repetition
Proceedings of the 18th annual international conference on Supercomputing
Proceedings of the 2006 international symposium on Low power electronics and design
QEMU, a fast and portable dynamic translator
ATEC '05 Proceedings of the annual conference on USENIX Annual Technical Conference
Proceedings of the eleventh international joint conference on Measurement and modeling of computer systems
SOI, interconnect, package, and mainboard thermal characterization
Proceedings of the 14th ACM/IEEE international symposium on Low power electronics and design
Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture
Characterizing processor thermal behavior
Proceedings of the fifteenth edition of ASPLOS on Architectural support for programming languages and operating systems
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Thermal behavior of modern processors is a first-order design constraint. However, accurate estimation of thermal behavior is time consuming, and techniques for accelerating performance simulations often yield inaccurate results when directly applied to thermal simulation, or do not reduce the thermal computation at all. This paper is the first to propose thermal sampling techniques. It can be integrated with existing phase-based and statistical-based architectural simulator sampling. The resulting simulator can perform accurate performance, power, and thermal characterization at close to 30 MIPS, on average, instead of 5 MIPS for the fastest sampling technique without thermal-aware sampling.