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ACM SIGARCH Computer Architecture News - Special issue: dasCMP'05
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Proceedings of the 2007 ACM SIGMOD international conference on Management of data
Carbon nanotube circuits in the presence of carbon nanotube density variations
Proceedings of the 46th Annual Design Automation Conference
Digital VLSI logic technology using Carbon Nanotube FETs: frequently asked questions
Proceedings of the 46th Annual Design Automation Conference
Probabilistic analysis and design of metallic-carbon-nanotube-tolerant digital logic circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Carbon nanotube correlation: promising opportunity for CNFET circuit yield enhancement
Proceedings of the 47th Design Automation Conference
Imperfection-immune VLSI logic circuits using carbon nanotube field effect transistors
Proceedings of the Conference on Design, Automation and Test in Europe
3D integration for energy efficient system design
Proceedings of the 48th Design Automation Conference
Carbon nanotube imperfection-immune digital VLSI: frequently asked questions updated
Proceedings of the International Conference on Computer-Aided Design
Wafer-Scale Growth and Transfer of Aligned Single-Walled Carbon Nanotubes
IEEE Transactions on Nanotechnology
Design Methods for Misaligned and Mispositioned Carbon-Nanotube Immune Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Nanotechnology
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Carbon Nanotube Field-Effect Transistors (CNFETs) are excellent candidates for building highly energy-efficient digital systems. However, imperfections inherent in carbon nanotubes (CNTs) pose significant hurdles to realizing practical CNFET circuits. In order to achieve CNFET VLSI systems in the presence of these inherent imperfections, careful orchestration of design and processing is required: from device processing and circuit integration, all the way to large-scale system design and optimization. In this paper, we summarize the key ideas that enabled the first experimental demonstration of CNFET arithmetic and storage elements. We also present an overview of a probabilistic framework to analyze the impact of various CNFET circuit design techniques and CNT processing options on system-level energy and delay metrics. We demonstrate how this framework can be used to improve the energy-delay-product (EDP) of CNFET-based digital systems.