Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Introductory Statistics
Design guidelines for metallic-carbon-nanotube-tolerant digital logic circuits
Proceedings of the conference on Design, automation and test in Europe
Digital VLSI logic technology using Carbon Nanotube FETs: frequently asked questions
Proceedings of the 46th Annual Design Automation Conference
Imperfection-immune VLSI logic circuits using carbon nanotube field effect transistors
Proceedings of the Conference on Design, Automation and Test in Europe
Design of compact imperfection-immune CNFET layouts for standard-cell-based logic synthesis
Proceedings of the Conference on Design, Automation and Test in Europe
Design Methods for Misaligned and Mispositioned Carbon-Nanotube Immune Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Digital VLSI logic technology using Carbon Nanotube FETs: frequently asked questions
Proceedings of the 46th Annual Design Automation Conference
Probabilistic analysis and design of metallic-carbon-nanotube-tolerant digital logic circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Carbon nanotube correlation: promising opportunity for CNFET circuit yield enhancement
Proceedings of the 47th Design Automation Conference
Carbon nanotube circuits: living with imperfections and variations
Proceedings of the Conference on Design, Automation and Test in Europe
Carbon nanotube imperfection-immune digital VLSI: frequently asked questions updated
Proceedings of the International Conference on Computer-Aided Design
A physical design tool for carbon nanotube field-effect transistor circuits
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Design and Analysis of a Robust Carbon Nanotube-Based Asynchronous Primitive Circuit
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Carbon nanotube circuits: opportunities and challenges
Proceedings of the Conference on Design, Automation and Test in Europe
Rapid exploration of processing and design guidelines to overcome carbon nanotube variations
Proceedings of the 50th Annual Design Automation Conference
Layout-driven robustness analysis for misaligned carbon nanotubes in CNTFET-based standard cells
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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Carbon Nanotubes (CNTs) are grown using chemical synthesis. As a result, it is extremely difficult to ensure exact positioning and uniform density of CNTs. Density variations in CNT growth can compromise reliability of Carbon Nanotube Field Effect Transistor (CNFET) circuits, and result in increased delay variations. A parameterized model for CNT density variations is presented based on experimental data extracted from aligned CNT growth. This model is used to quantify the impact of such variations on design metrics such as noise margin and delay variations of CNFET circuits. Finally, we analyze correlation that exists in aligned CNT growth, and demonstrate how the reliability of CNFET circuits can be significantly improved by taking advantage of such correlation.