UVM-based verification methodology for RFID-enabled smart-sensor systems

  • Authors:
  • Muralikrishna Sathyamurthy;Felix Neumann;Lukasz Kotynia;Eckhard Hennig

  • Affiliations:
  • Institute for Microelectronic and Mechatronic Systems GmbH, Ilmenau, Germany 98693;Bosch-Sensortec, Dresden, Germany 01099;Department of Microelectronics and Computer Science, Technical University of Lodz, Lodz, Poland 90924;Institute for Microelectronic and Mechatronic Systems GmbH, Ilmenau, Germany 98693

  • Venue:
  • Analog Integrated Circuits and Signal Processing
  • Year:
  • 2014

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Abstract

Universal verification methodology (UVM) is a standardized methodology for verifying integrated circuit designs. In this contribution, we present a UVM-based verification methodology for verifying mixed-signal smart-sensor systems. Our approach permits the validation of system functionality before implementation and also to verify the implementation on various levels of abstraction. The model-based verification approach enables to build a scalable and reusable framework, in which assertions and constrained-random stimuli are used to monitor and also to verify mixed-signal-system behavior automatically. A comprehensive example of an radio-frequency identification-based smart-sensor mixed-signal system used for bioanalytical applications is presented. Along with the designed UVM test bench architecture, we describe a novel solution for estimating the power consumption of the digital sub-system using application-specific random-activity patterns generated during UVM test bench runs (Neumann et al., Synthesis Modelling Analysis and Simulation Methods and Application to Circuit Design, SMACD, 2012).