A tabu search heuristic for the multi-depot vehicle routing problem
Computers and Operations Research
Computers and Intractability: A Guide to the Theory of NP-Completeness
Computers and Intractability: A Guide to the Theory of NP-Completeness
Local Optimization and the Traveling Salesman Problem
ICALP '90 Proceedings of the 17th International Colloquium on Automata, Languages and Programming
A linear-time heuristic for improving network partitions
DAC '82 Proceedings of the 19th Design Automation Conference
A Proposal for Routing-Based Timing-Driven Scan Chain Ordering
ISQED '03 Proceedings of the 4th International Symposium on Quality Electronic Design
An Efficient Low-Overhead Policy for Constructing Multiple Scan-Chains
ATS '04 Proceedings of the 13th Asian Test Symposium
Routing-aware scan chain ordering
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint
DFT '06 Proceedings of the 21st IEEE International Symposium on on Defect and Fault-Tolerance in VLSI Systems
A hybrid genetic algorithm for the multi-depot vehicle routing problem
Engineering Applications of Artificial Intelligence
Scan chain clustering for test power reduction
Proceedings of the 45th annual Design Automation Conference
A comparison of five heuristics for the multiple depot vehicle scheduling problem
Journal of Scheduling
Efficient stochastic hybrid heuristics for the multi-depot vehicle routing problem
Robotics and Computer-Integrated Manufacturing
Certification of an optimal TSP tour through 85,900 cities
Operations Research Letters
Layout driven synthesis of multiple scan chains
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Improving test effectiveness of scan-based BIST by scan chain partitioning
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Testability of ECO logic is currently a significant bottleneck in the SOC implementation flow. Front-end designers sometimes require large functional ECOs close to scheduled tapeout dates or for later design revisions. To avoid loss of test coverage, ECO flip-flops must be added into existing scan chains with minimal increase to test time and minimal impact on existing routing and timing slack. We address a new Incremental Multiple-Scan Chain Ordering problem formulation to automate the tedious and time-consuming process of scan stitching for large functional ECOs. We present a heuristic with clustering, incremental clustering and ordering steps to minimize the maximum chain length (test time), routing congestion, and disturbance to existing scan chains. Test times for our incremental scan chain solutions are reduced by 5.3%, and incremental wirelength costs are reduced by 45.71%, compared to manually-solved industrial testcases.