Model-based dummy feature placement for oxide chemical-mechanical polishing manufacturability
Proceedings of the 37th Annual Design Automation Conference
Practical iterated fill synthesis for CMP uniformity
Proceedings of the 37th Annual Design Automation Conference
Monte-Carlo algorithms for layout density control
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
Closing the smoothness and uniformity gap in area fill synthesis
Proceedings of the 2002 international symposium on Physical design
ISQED '03 Proceedings of the 4th International Symposium on Quality Electronic Design
Mask distortion issues for next-generation lithography
Microelectronic Engineering - Proceedings of the symposium and summer school on: Nano and Giga challenges in microelectronics research and opportunities in Russia
A fast approximation scheme for fractional covering problems with variable upper bounds
SODA '04 Proceedings of the fifteenth annual ACM-SIAM symposium on Discrete algorithms
Provably good and practically efficient algorithms for CMP dummy fill
Proceedings of the 46th Annual Design Automation Conference
Density gradient minimization with coupling-constrained dummy fill for CMP control
Proceedings of the 19th international symposium on Physical design
Filling algorithms and analyses for layout density control
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
An efficient approach to multilayer layer assignment with an application to via minimization
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Compressible area fill synthesis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fast Dummy-Fill Density Analysis With Coupling Constraints
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In advanced VLSI fabrication, dummy fill is widely employed to solve the pattern dependent manufacturability issues. In this paper, a new linear programming formulation for dummy fill synthesis is proposed, which takes more consideration to the density gradient besides the pattern density. Based on the covering linear programming (CLP), a fast iterative approximation scheme is designed to solve this newly formulated problem. The complexity of the new method is proved to be O(n^2log(n)). Experimental results demonstrate the effectiveness of the new formulation, and show good accuracy and time efficiency of the proposed method. Compared with the ordinary LP method, speedup over magnitude is achieved with the acceptable overfill amount.