On-Line Error Detection for Bit-Serial Multipliers in GF(2m)
Journal of Electronic Testing: Theory and Applications
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing
Journal of Electronic Testing: Theory and Applications
A linear code-preserving signature analyzer COPMISR
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
15.1 A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
An Efficient On-line-Test and Back-up Scheme for Embedded Processors
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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