Efficient Testing of Optimal Time Adders
IEEE Transactions on Computers
Easily Testable Iterative Logic Arrays
IEEE Transactions on Computers
A Spanning Tree Carry Lookahead Adder
IEEE Transactions on Computers - Special issue on computer arithmetic
Constant testability of combinational cellular tree structures
Journal of Electronic Testing: Theory and Applications
Quality Testing Requires Quality Thinking
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
DOs and DON'Ts in Computing Fault Coverage
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Testing and error detection in iterative logic arrays
Testing and error detection in iterative logic arrays
Testability Properties of Divergent Trees
Journal of Electronic Testing: Theory and Applications
An Effective Built-In Self-Test Scheme for Parallel Multipliers
IEEE Transactions on Computers
On the properties of the input pattern fault model
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Easily Testable Cellular Carry Lookahead Adders
Journal of Electronic Testing: Theory and Applications
The input pattern fault model and its application
EDTC '97 Proceedings of the 1997 European conference on Design and Test
An Effective BIST Scheme for Arithmetic Logic Un i t s
ITC '97 Proceedings of the 1997 IEEE International Test Conference
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The testing properties of a class of regular circuits called convergent trees are investigated. Convergent trees include such practical circuits as comparators, multiplexers, and carry-lookahead adders. The conditions for the testability of these tree circuits are derived for a functional fault model. The notion of L-testability is introduced, where the number of tests for a p-level tree is directly proportional to p, rather than exponential in p. Convergent trees that are C-testable (testable with a fixed number of tests, regardless of the tree's size) are also characterized. Two design techniques are also introduced that modify arbitrary tree modules in order to achieve L- and C-testability. Finally, we apply these techniques to the design of a large carry-lookahead adder.