Statistical estimation of average power dissipation in CMOS VLSI circuits using nonparametric techniques

Authors:
L. Yuan;C. Teng;S. Kang
Affiliations:
Dept. of ECE and Coordinated Science Lab., U. of Illinois at Urbana-Champaign, 1308 W. Main St., Urbana, IL;EPIC Design Technology, Inc., 310 N. Mary Ave., Sunnyvale, CA;Dept. of ECE and Coordinated Science Lab., U. of Illinois at Urbana-Champaign, 1308 W. Main St., Urbana, IL
Venue:
ISLPED '96 Proceedings of the 1996 international symposium on Low power electronics and design
Year:
1996

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