On-Line Testing for VLSI—A Compendium of Approaches
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
Thermal Monitoring of Self-Checking Systems
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
Differential Thermal Testing: An Approach to its Feasibility
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
CMOS Differential and Absolute Thermal Sensors
Journal of Electronic Testing: Theory and Applications
Tracing the Thermal Behavior of ICs
IEEE Design & Test
Thermal Testing of Analogue Integrated Circuits: A Case Study
Journal of Electronic Testing: Theory and Applications
4T-decay sensors: a new class of small, fast, robust, and low-power, temperature/leakage sensors
Proceedings of the 2004 international symposium on Low power electronics and design
GAARP: A Power-Aware GALS Architecture for Real-Time Algorithm-Specific Tasks
IEEE Transactions on Computers
Collaborative sensing of on-chip wire temperatures using interconnect based ring oscillators
Proceedings of the 18th ACM Great Lakes symposium on VLSI
A dual-MOSFET equivalent resistor thermal sensor
Proceedings of the 19th ACM Great Lakes symposium on VLSI
On process variation tolerant low cost thermal sensor design in 32nm CMOS technology
Proceedings of the 19th ACM Great Lakes symposium on VLSI
Accurate operation of a CMOS integrated temperature sensor
Microelectronics Journal
A high sensitivity and process tolerant digital thermal sensing scheme for 3-D Ics
Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI
Low-power area-efficient wide-range robust CMOS temperature sensors
Microelectronics Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Spintronic memristor based temperature sensor design with CMOS current reference
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Nano Watt CMOS temperature sensor
Analog Integrated Circuits and Signal Processing
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The paper presents appropriate sensors for the realization of the design principle of design for thermal testability (DfTT). After a short overview of the available CMOS temperature sensors, a new family of temperature sensors will be presented, developed by the authors especially for the purpose of thermal monitoring of VLSI chips. These sensors are characterized by the very low silicon area of about 0.003-0.02 mm/sup 2/ and the low power consumption (200 /spl mu/W). The accuracy is in the order of 1/spl deg/C. Using the frequency-output versions an easy interfacing of digital test circuitry is assured. They can be very easily incorporated into the usual test circuitry, via the boundary-scan architecture. The paper presents measured results obtained by the experimental circuits. The facilities provided by the sensor connected to the boundary-scan test circuitry are also demonstrated experimentally.