Accurate and efficient macromodel of submicron digital standard cells

  • Authors:
  • Cristiano Forzan;Bruno Franzini;Carlo Guardiani

  • Affiliations:
  • SGS-Thomson Microelectronics, via C. Olivetti, 2, 20041 Agrate Brianza (MI), Italy;SGS-Thomson Microelectronics, via C. Olivetti, 2, 20041 Agrate Brianza (MI), Italy;SGS-Thomson Microelectronics, via C. Olivetti, 2, 20041 Agrate Brianza (MI), Italy

  • Venue:
  • DAC '97 Proceedings of the 34th annual Design Automation Conference
  • Year:
  • 1997

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Abstract

In this paper a new analytic gate delay modelingtechnique is presented that allows to accuratelyreproduce the timing behavior of deep submicron digitalstandard cells for a large range of operating conditions.The proposed technique sensibly improves the accuracyof the existing analytic delay models and it usuallyrequires less simulations for the cell characterization.Moreover it is compatible with the most advanced interconnectdelay models that have been recently proposed inthe literature.