Post-route optimization for improved yield using a rubber-band wiring model

  • Authors:
  • Jeffrey Z. Su;Wayne W. Dai

  • Affiliations:
  • Dept. of Computer Engineering, University of California, Santa Cruz, CA;Dept. of Computer Engineering, University of California, Santa Cruz, CA

  • Venue:
  • ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 1997

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Abstract

This paper presents a unique approach to improve yield given a routed layout. Currently after routing has been completed and compacted, it generally proceeds to verification without further modifications. However, to improve manufacturability, we introduce a concept called even wire distribution, a key element of the SURF physical design tool. To alleviate congestion, we first move vias and wires torwards less dense areas in a manner which preserves the existing wiring paths. Depending on locally available area, we then increase wire spacing to reduce defect sensitivity, without changing the area of the design. Carafe, an inductive fault analysis tool is used to evaluate the new layout.