Multiple Experiment Environments for Testing

Authors:
Karen Panetta Lentz;Elias S. Manolakos;Edward Czeck;Jamie Heller
Affiliations:
Tufts University, Department of Electrical and Computer Engineering, Medford, MA 02155. E-mail: karen@eecs.tufts.edu;Northeastern University, Electrical and Computer Engineering Department, Boston, MA 02115. E-mail: elias@cdsp.neu.edu;Chrysalis Symbolic Design, 101 Billerica Ave, N. Billerica, MA 01862;Tufts University, Department of Electrical Engineering and Computer Science, Medford, MA 02155. E-mail: jheller@eecs.tufts.edu
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
1997

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Abstract

The testability of a class of regular circuits calleddivergent trees is investigated under a functional fault model. Divergent trees include such practical circuits as decoders anddemultiplexers. We prove that uncontrolled divergent trees aretestable ...