Symbolic simulation—techniques and applications
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Symbolic Boolean manipulation with ordered binary-decision diagrams
ACM Computing Surveys (CSUR)
Formal verification by symbolic evaluation of partially-ordered trajectories
Formal Methods in System Design - Special issue on symbolic model checking
Logic verification methodology for PowerPC microprocessors
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Formal verification of PowerPC arrays using symbolic trajectory evaluation
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Formal verification of content addressable memories using symbolic trajectory evaluation
DAC '97 Proceedings of the 34th annual Design Automation Conference
PowerPCTM Array Verification Methodology using Formal Techniques
Proceedings of the IEEE International Test Conference on Test and Design Validity
Proceedings of the IEEE International Test Conference
The PowerPC 603TM Microprocessor: An Array Built-In Self-Test Mechanism
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
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Design validation for embedded arrays remains as a challenging problem in today's microprocessor design environment. At Somerset, validation of array designs relies on both formal verification and vector simulation. Although several methods for array design validation have been proposed and had great success [Ganguly et al. 1996; Pandey et al. 1996, 1997; Wang and Abadir 1997], little evidence has been reported for the effectiveness of these methods with respect to the detection of design errors. In this paper, we measure the effectiveness of different validation approaches based on automatic design error injection and simulation. The technique provides a systematic way to evaluate various validation approaches at both logic and transistor levels. Experimental results on recent PowerPC microprocessor arrays will be discussed and reported.