Automatic generation and verification of sufficient correctness properties for synchronous processors

• Authors:

• Filip Van Aelten;Stan Y. Liao;Jonathan Allen;Srinivas Devadas

• Affiliations:

• Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA;Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA;Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA;Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA

• Venue:
• ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
• Year:
• 1992