Automatic test generation for linear digital systems with bi-level search using matrix transform methods

  • Authors:
  • R. K. Roy;A. Chatterjee;J. H. Patel;J. A. Abraham;M. A. d'Abreu

  • Affiliations:
  • C&C Research Labs, NEC, 4 Independence Way, Princeton, NJ;General Electric R&D Center, 1 River Road, Schenectady, NY;CRHC, University of Illinois, 1101 W. Springfield, Urbana, IL;CERC, University of Texas, 2201 Donley Drive, Ste. 395, Austin, TX;General Electric R&D Center, 1 River Road, Schenectady, NY

  • Venue:
  • ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 1992

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Abstract