A dynamic programming approach to the test point insertion problem
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
IEEE Transactions on Computers
SCOAP: Sandia controllability/observability analysis program
DAC '80 Proceedings of the 17th Design Automation Conference
Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
IEEE Transactions on Computers
Non-scan design-for-testability techniques for sequential circuits
DAC '93 Proceedings of the 30th international Design Automation Conference
Non-scan design-for-testability of RT-level data paths
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Exploiting hardware sharing in high-level synthesis for partial scan optimization
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Transforming behavioral specifications to facilitate synthesis of testable designs
ITC'94 Proceedings of the 1994 international conference on Test
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