Mixed-level fault coverage estimation

Authors:
Hi Keung Ma;Alberto L. Sangiovanni-Vincentelli
Affiliations:
Department of Electrical Engineering and Computer Science, University of California, Berkeley, CA;Department of Electrical Engineering and Computer Science, University of California, Berkeley, CA
Venue:
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
Year:
1986

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Abstract

A Fault coverage estimation technique for mixed-level circuit is described. Observability formulae for combinational multiple-input multiple-output functional block are derived. Special procedures for estimating CMOS circuit transistor fault detection probability are developed, and the implementation of a FAult Coverage Estimation (FACE) system is described.