Routing with a scanning window-8Ma unified approach

Authors:
D. Kaplan
Affiliations:
Intel Corporation, Santa Clara, California
Venue:
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
Year:
1987

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Abstract

A general approach to routing by a scanning window is presented, and an experimental switch-box router based on this approach is described. This router first grades conductor segments that are candidates to enter the window according to their estimated contributions to routing success, and then uses a quasi-maximal set of segments. A grade function that imitates human intuition is also described.