On the impact of on-chip inductance on signal nets under the influence of power grid noise

  • Authors:
  • T. Chen

  • Affiliations:
  • Systems VLSI Technology Organization, Hewlett-Packard Company, Fort Collins, CO

  • Venue:
  • Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 2001

Quantified Score

Hi-index 0.00

Visualization

Abstract