IC analyses including extracted inductance models

  • Authors:
  • Michael W. Beattie;Lawrence T. Pileggi

  • Affiliations:
  • Carnegie Mellon University, Dept. of ECE, 5000 Forbes Ave., Pittsburgh, PA;Carnegie Mellon University, Dept. of ECE, 5000 Forbes Ave., Pittsburgh, PA

  • Venue:
  • Proceedings of the 36th annual ACM/IEEE Design Automation Conference
  • Year:
  • 1999

Quantified Score

Hi-index 0.00

Visualization

Abstract