Checkpoint Faults are not Sufficient Target Faults for Test Generation

Authors:
M. Abramovici;P. R. Menon
Affiliations:
AT&T Information Systems, Naperville, IL;AT&T Information Systems, Naperville, IL
Venue:
IEEE Transactions on Computers
Year:
1986

Citing 4
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Abstract

Stuck-at faults on primary inputs and fan-out branches are commonly used as target faults in test generation algorithms for combinational circuits. This correspondence shows that these faults may not constitute an adequate set of target faults. A procedure is presented for selecting a set of target faults with the property that the detection of all detectable faults from this set guarantees the detection of all detectable faults in the circuit.