On yield, fault distributions, and clustering of particles
IBM Journal of Research and Development
Row/Column Replacement for the Control of Hard Defects in Semiconductor RAM's
IEEE Transactions on Computers
Modeling the Effect of Redundancy on Yield and Performance of VLSI Systems
IEEE Transactions on Computers
Modeling Defect Spatial Distribution
IEEE Transactions on Computers
On the repair of redundant RAMs
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
A guided tour of Chernoff bounds
Information Processing Letters
Probabilistic analysis and algorithms for reconfiguration of memory arrays
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Generation of Minimal Vertex Covers for Row/Column Allocation in Self-Repairable Arrays
IEEE Transactions on Computers
Constraint Bipartite Vertex Cover Simpler Exact Algorithms and Implementations
FAW '08 Proceedings of the 2nd annual international workshop on Frontiers in Algorithmics
Constraint bipartite vertex cover: simpler exact algorithms and implementations
Journal of Combinatorial Optimization
Probabilistic diagnosis of clustered faults for shared structures
Mathematical and Computer Modelling: An International Journal
Communication in networks with random dependent faults
MFCS'07 Proceedings of the 32nd international conference on Mathematical Foundations of Computer Science
| Hi-index | 14.98 |
Reconfiguration of memory array using spare rows and spare columns, which has been shown to be a useful technique for yield enhancement of memories, is considered. A clustered failure model that adopts the center-satellite approach of F.J. Meyer and D.K. Pradhan (1989) is proposed and utilized to show that the total number of faulty cells that can be tolerated when clustering occurs is larger than when faults are independent. It is also shown that an optimal solution to the reconfiguration problem can be found in polynomial time for a special case of the clustering model. An efficient approximation algorithm is given for the general case of the probabilistic model assumed. It is shown, through simulation, that the computation time required by this algorithm to repair large arrays containing a significant number of clustered faults is small.