Diagnosis of Scan Chain Failures

Authors:
Yuejian Wu
Affiliations:
-
Venue:
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
Year:
1998

Citing 0
Cited 13

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Intermittent Scan Chain Fault Diagnosis Based on Signal Probability Analysis

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Diagnosis of Multiple Hold-Time and Setup-Time Faults in Scan Chains

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Quick Scan Chain Diagnosis Using Signal Profiling

ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Using fault model relaxation to diagnose real scan chain defects

Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Yield Enhancement Methodology for CMOS Standard Cells

ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Dynamic learning based scan chain diagnosis

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Diagnosis, modeling and tolerance of scan chain hold-time violations

Proceedings of the conference on Design, automation and test in Europe
A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques

ACM Transactions on Design Automation of Electronic Systems (TODAES)
A design-for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults

Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Scan chain hold-time violations: can they be tolerated

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Diagnosis of single stuck-at faults and multiple timing faults in scan chains

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
An ATE assisted DFD technique for volume diagnosis of scan chains

Proceedings of the 50th Annual Design Automation Conference

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Abstract

This paper analyzes faulty scan chain behaviors. In addition, to stuck-at faults, we also consider timing faults due to hold time violations. Test sequences to determine the fault types in a failing scan chain are presented. This is followed by a presentation of two scan design techniques that simplifies scan chain fault diagnosis for both stuck-at and timing faults.