Fault simulation of interconnect opens in digital CMOS circuits
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits
ITC '97 Proceedings of the 1997 IEEE International Test Conference
PENTIUM® PRO PROCESSOR DESIGN FOR TEST AND DEBUG
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Estimating detection probability of interconnect opens using stuck-at tests
Proceedings of the 14th ACM Great Lakes symposium on VLSI
Detection probabilities of interconnect breaks: an analysis
Integration, the VLSI Journal - Special issue: ACM great lakes symposium on VLSI
A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines
Journal of Electronic Testing: Theory and Applications
Detection probabilities of interconnect breaks: an analysis
Integration, the VLSI Journal - Special issue: ACM great lakes symposium on VLSI
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