Identification and Test Generation for Primitive Faults

Resynthesis of Combinational Circuits for Path Count Reduction and for Path Delay Fault Testability

Journal of Electronic Testing: Theory and Applications - Special issue on test synthesis

Test generation for primitive path delay faults in combinational circuits

ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design

On primitive fault test generation in non-scan sequential circuits

Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design

Path delay fault testing using test points

ACM Transactions on Design Automation of Electronic Systems (TODAES)

A new path-oriented effect-cause methodology to diagnose delay failures

ITC '98 Proceedings of the 1998 IEEE International Test Conference

20.1 A Nonenumerative ATPG for Functionally Sensitizable Path Delay Faults

VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium

ENHANCED DELAY DEFECT COVERAGE WITH PATH-SEGMENTS

ITC '00 Proceedings of the 2000 IEEE International Test Conference

TESTING OF CRITICAL PATHS FOR DELAY FAULTS

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Design for Primitive Delay Fault Testability

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Robust Testability of Primitive Faults using Test Points

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Exploring linear structures of critical path delay faults to reduce test efforts

Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design