Iterative [simulation-based genetics + deterministic techniques]= complete ATPG0
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Symbolic exploration of large circuits with enhanced forward/backward traversals
EURO-DAC '94 Proceedings of the conference on European design automation
A parallel sequential test generation system DESCARTES based on real-valued logic simulation
ATS '95 Proceedings of the 4th Asian Test Symposium
Testability forecasting for sequential circuits
ATS '95 Proceedings of the 4th Asian Test Symposium
A practical approach to instruction-based test generation for functional modules of VLSI processors
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
An automatic test pattern generator for large sequential circuits based on genetic algorithms
ITC'94 Proceedings of the 1994 international conference on Test
Full symbolic ATPG for large circuits
ITC'94 Proceedings of the 1994 international conference on Test
| Hi-index | 0.00 |