CTL the language for describing core-based test

Authors:
Rohit Kapur;Maurice Lousberg;Tony Taylor;Brion L. Keller;Paul Reuter;Douglas Kay
Affiliations:
-;-;-;-;-;-
Venue:
Proceedings of the IEEE International Test Conference 2001
Year:
2001

On IEEE P1500's Standard for Embedded Core Test

Journal of Electronic Testing: Theory and Applications
A Novel Reconfigurable Wrapper for Testing of Embedded Core-Based SOCs and its Associated Scheduling Algorithm

Journal of Electronic Testing: Theory and Applications
The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs

Journal of Electronic Testing: Theory and Applications
Test-model based hierarchical DFT synthesis

Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
A New Methodology for Improved Tester Utilization

ITC '01 Proceedings of the 2001 IEEE International Test Conference
Design of reconfigurable access wrappers for embedded core based SoC test

IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power
STEAC: a platform for automatic SOC test integration

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Bridging test languages to reuse test information: a metamodel for test information

IRI'09 Proceedings of the 10th IEEE international conference on Information Reuse & Integration

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