99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor

Creating Value Through Test

DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

Performance verification of high-performance ASICs using at-speed structural test

GLSVLSI '06 Proceedings of the 16th ACM Great Lakes symposium on VLSI

A flexible and scalable methodology for GHz-speed structural test

Proceedings of the 43rd annual Design Automation Conference

CASP: concurrent autonomous chip self-test using stored test patterns

Proceedings of the conference on Design, automation and test in Europe

Blue Gene/L compute chip: control, test, and bring-up infrastructure

IBM Journal of Research and Development

Structural and functional test of IBM system z10 chips

IBM Journal of Research and Development

On the relationship between stuck-at fault coverage and transition fault coverage

Proceedings of the Conference on Design, Automation and Test in Europe

Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors

Journal of Electronic Testing: Theory and Applications

Scalable and modular pervasive logic/firmware design

IBM Journal of Research and Development