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Journal of Electronic Testing: Theory and Applications
On the Use of Fully Specified Initial States for Testing of Synchronous Sequential Circuits
IEEE Transactions on Computers
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VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
On the Detection of Reset Faults in Synchronous Sequential Circuits
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
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