LFSR-Based Deterministic TPG for Two-Pattern Testing
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
BIST Test Pattern Generators for Two-Pattern Testing-Theory and Design Algorithms
IEEE Transactions on Computers
A BIST scheme for the detection of path-delay faults
ITC '98 Proceedings of the 1998 IEEE International Test Conference
On the Generation of Pseudo-Deterministic Two-Patterns Test Sequence with LFSRs
EDTC '97 Proceedings of the 1997 European conference on Design and Test
An optimized BIST test pattern generator for delay testing
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
BIST-Based Delay Path Testing in FPGA Architectures
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Scan Array Solution for Testing Power and Testing Time
ITC '01 Proceedings of the 2001 IEEE International Test Conference
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
Scalable Delay Fault BIST for Use with Low-Cost ATE
Journal of Electronic Testing: Theory and Applications
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