Generation of Optimized Single Distributions of Weights for Random Built-in Self-Test

Efficient random testing with global weights

EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation

On-Chip Weighted Random Patterns

Journal of Electronic Testing: Theory and Applications

Distributed Generation of Weighted Random Patterns

IEEE Transactions on Computers

Pseudorandom, Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata

EDCC-3 Proceedings of the Third European Dependable Computing Conference on Dependable Computing

10.3 Distributed Generation of Weighted Random Patterns

VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium

A BIST Pattern Generator Design for Near-Perfect Fault Coverage

IEEE Transactions on Computers

Column-matching based mixed-mode test pattern generator design technique for BIST

Microprocessors & Microsystems

Fixed-biased pseudorandom built-in self-test for random pattern resistant circuits

ITC'94 Proceedings of the 1994 international conference on Test