Improved sequential ATPG using functional observation information and new justification methods

Authors:
Jaehong Park;Chanhee Oh;M. R. Mercer
Affiliations:
Dept. of Electrical and Computer Engineering, The University of Texas at Austin, Austin TX;Dept. of Electrical and Computer Engineering, The University of Texas at Austin, Austin TX;Dept. of Electrical and Computer Engineering, The University of Texas at Austin, Austin TX
Venue:
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Year:
1995

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Abstract

Sequential ATPG (Automatic Test Pattern Generation) is a very desirable CAD tool, but to date, the site and complexity of circuits for which sequential ATPG could be performed has been limited. We have discovered a method for collecting functional information which makes fault observation significantly easier. We also propose a new method for state justification which is a combination of function-based methods and structure-based methods. Our sequential ATPG system deals with circuits without a reset state or a synchronizing sequence, and the experimental results show that the proposed method achieves significant improvements over existing sequential ATPG methods.