Behavioral synthesis of highly testable data paths under the non-scan and partial scan environments
DAC '93 Proceedings of the 30th international Design Automation Conference
Testability analysis and improvement from VHDL behavioral specifications
EURO-DAC '94 Proceedings of the conference on European design automation
A controller-based design-for-testability technique for controller-data path circuits
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Enhancing high-level control-flow for improved testability
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Exploiting hardware sharing in high-level synthesis for partial scan optimization
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Testability Insertion in Behavioral Descriptions
ISSS '96 Proceedings of the 9th international symposium on System synthesis
A test synthesis technique using redundant register transfers
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
High-Level Controllability and Observability Analysis for Test Synthesis
Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis
Keynote speech: testing methodologies for embedded systems and systems-on-chip
ICESS'04 Proceedings of the First international conference on Embedded Software and Systems
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This paper presents a testability analysis and improvement technique for the controller of an RT level design. It detects hard-to-reach states by analyzing both the data path and the controller of a design. The controller is modified using register initialization, branch control, and loop termination methods to enhance its state reachability. This technique complements the data path scan method and can be used to avoid scanning registers involved in the critical paths. Experimental results show the improvement of fault coverage with a very low area overhead.