An improved approach to fault tolerant rank order filtering on a SIMD mesh processor

Authors:
Jai-Hoon Kim;F. Lombardi;N. H. Vaidya
Affiliations:
-;-;-
Venue:
DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
Year:
1995

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Abstract

This paper presents an approach for the fault tolerant computation of the rank order filtering on a SIMD (Single Instruction Multiple Data) mesh processes such as the MasPar. The proposed approach improves over a previous approach in two respects: by changing the data dependency in the execution of the rank order filtering, a new algorithm with constant execution time complexity can be designed; and by introducing a dependency for the rank values of faulty PEs as computed by neighboring (fault free) processing elements (PEs), a lower distortion can be achieved for enhancement of the image.