An Efficient Algorithm for Sequential Circuit Test Generation
IEEE Transactions on Computers
SMART And FAST: Test Generation for VLSI Scan-Design Circuits
IEEE Design & Test
Simulation-based techniques for dynamic test sequence compaction
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Static compaction using overlapped restoration and segment pruning
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Efficient Techniques for Dynamic Test Sequence Compaction
IEEE Transactions on Computers
FreezeFrame: compact test generation using a frozen clock strategy
DATE '99 Proceedings of the conference on Design, automation and test in Europe
A Practical Vector Restoration Technique for Large Sequential Circuits
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
Static test sequence compaction based on segment reordering and accelerated vector restoration
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Putting the Squeeze on Test Sequences
ITC '97 Proceedings of the 1997 IEEE International Test Conference
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This report presents three dynamic methods for reducing the number of test vectors for sequential circuit test pattern generation. All methods work by taking a test sequence generated by the main ATPG program for a single fault and assigning the unspecified primary inputs with specific values. The completely filled test sequence can then be shown by simulation to pick up more faults than the one for which it was generated. All three approaches are presented and discussed, with the last method justified and explained in more detail than the others. Each method has been incorporated into the FASTEST sequential automatic test pattern generator. Experimental results using many of the ISCAS-89 sequential benchmark circuits are presented for all approaches that demonstrate their effectiveness in comparison to the widely used approach of performing a single random fill on all unspecified inputs.