Self-exercising self testing k-order comparators

  • Authors:
  • X. Kavousianos;D. Nikolos

  • Affiliations:
  • -;-

  • Venue:
  • VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
  • Year:
  • 1997

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Abstract

In this paper we give a systematic method to design self-exercising (SE) self testing k-order comparators. The k-order comparator is defined as a combinational circuit that compares two operands and decides if these differ in less than k bits. According to this definition the usual equality comparator is the 1st-order comparator. Also in this paper we discuss the applicability of the k-order comparators in the implementation of (k-1)-EC/AUED, (k-1)-EC/d-ED/AUED, (k-1)-EC/d-UED and (k-1)-EC/d-ED/f-UED codes as well as in the design of a fault tolerant cache memory and broadcast networks.