Synthesis of reversible sequential elements
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Reversible online BIST using bidirectional BILBO
Proceedings of the 7th ACM international conference on Computing frontiers
Fault diagnosis in reversible circuits under missing-gate fault model
Computers and Electrical Engineering
Integration, the VLSI Journal
Derivation of test set for detecting multiple missing-gate faults in reversible circuits
Computers and Electrical Engineering
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Irreversible computation necessarily results in energy dissipationdue to information loss. While small in comparison to thepower consumption of today's VLSI circuits, if current trends continuethis will be a critical issue in the near future. Reversiblecircuits offer an alternative that, in principle, allows computationwith arbitrarily small energy dissipation. Furthermore, reversiblecircuits are essential components of quantum logic. We considerthe problem of testing these circuits, and in particular, generatingefficient test sets. The reversibility property significantly simplifiesthe problem, which is generally hard for the irreversible case.We discuss conditions for a test set to be complete, give a numberof practical constructions, and consider test sets for worst-casecircuits. In addition, we formulate the problem of finding minimaltest sets into an integer linear program (ILP) with binaryvariables. While this ILP method is infeasible for large circuits,we show that combining it with a circuit decomposition approachyields a practical alternative.