Implementing 1149.1 in the PowerPCTM RISC Microprocessor Family
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
A BIST Methodology for Comprehensive Testing of RAM with Reduced Heat Dissipation
Proceedings of the IEEE International Test Conference on Test and Design Validity
Detection of "Undetectable" Faults Using IDDQ Testing
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Testabilty Features of the MC 68060 Microprocessor
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
The Direct-Mapped Instruction Cache for ColdFire Processors
ICCD '96 Proceedings of the 1996 International Conference on Computer Design, VLSI in Computers and Processors
Test Development for Second-Generation ColdFire Microprocessors
IEEE Design & Test
Defect level prediction for I_DDQ testing
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Testability Evaluation of Sequential Designs Incorporating the Multi-Mode Scannable Memory Element
ITC '99 Proceedings of the 1999 IEEE International Test Conference
The Testability Features of the 3rd Generation Coldfire® Family of Microprocessors
ITC '99 Proceedings of the 1999 IEEE International Test Conference
DFT Advances in Motorola's MPC7400, a PowerPCTM Microprocessor
ITC '99 Proceedings of the 1999 IEEE International Test Conference
AC Scan Path Selection for Physical Debugging
IEEE Design & Test
Low Voltage Test in Place of Fast Clock in DDSI Delay Test
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
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A case study of the development of the design for testmethodology of the second generation of the ColdFire ®Microprocessor Family is described from the viewpoint ofgoals, initial strategy and implementation. Methodologyincludes at-speed scan path design, path delay testing,I DDQ , and direct access test modes for embedded memories.Scan tests are applied with timing identical to thatspecified for peak performance normal operation.