A comparative study of power efficient SRAM designs
GLSVLSI '00 Proceedings of the 10th Great Lakes symposium on VLSI
Block-Enabled Memory Macros: Design Space Exploration and Application-Specific Tuning
Proceedings of the conference on Design, automation and test in Europe - Volume 1
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Minimizing power dissipation during write operation to register files
ISLPED '07 Proceedings of the 2007 international symposium on Low power electronics and design
Modified essential spare pivoting algorithm for embedded memories with global block-based redundancy
CSS '07 Proceedings of the Fifth IASTED International Conference on Circuits, Signals and Systems
Efficient BISR techniques for embedded memories considering cluster faults
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Efficient built-in redundancy analysis for embedded memories with 2-d redundancy
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
PATMOS'05 Proceedings of the 15th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
Hi-index | 0.00 |
This Paper presents a novel hierarchical divided bit-line approach for reducing active power in SRAMs by reducing bit-line capacitance. Two or more 6T SRAM cells are combined together to divide the bit-line into several sub bit-lines. These sub bit-lines are again combined to form two or more levels of hierarchy. This division of bit-line into hierarchical sub bit-lines results in reduction of bit-line capacitance, which reduces active power and access time. Optimum values for number of levels of hierarchy and number of blocks combined at each level have been derived. Experimental results show that observed parameters and estimated ones follow the same trend. It is shown that the reduction in bit-line capacitance reduces active power consumption by 50-60% and also reduces access time by about $20\% $ at the expense of approximately 5% increase in the number of transistors. This approach is further extended by incorporating the controlled voltage swing on bit-lines. This extension reduces the power consumption by another 20-30%.