Fault Dictionary Size Reduction through Test Response Superposition

Authors:
Baris Arslan
Affiliations:
-
Venue:
ICCD '02 Proceedings of the 2002 IEEE International Conference on Computer Design: VLSI in Computers and Processors (ICCD'02)
Year:
2002

Citing 0
Cited 5

Design space exploration for aggressive test cost reduction in CircularScan architectures

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Improve the Quality of Per-Test Fault Diagnosis Using Output Information

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Reducing fault dictionary size for million-gate large circuits

ACM Transactions on Design Automation of Electronic Systems (TODAES)
Design and analysis of compact dictionaries for diagnosis in scan-BIST

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

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Abstract

The exceedingly large size of fault dictionaries constitutes a fundamental obstacle to their usage. We outline a new method to reduce significantly the size of fault dictionaries. The proposed method partitions the test set and a combined signature is stored for each partition. The new approach aims to provide high diagnostic resolution with a small number of combined signatures. The experimental results show a considerable decrease in the storage requirementof fault dictionaries.